Niu Xiaoyan, Liu Tieqiao, Li Yujun. Graphics Processing Unit Accelerated Small Delay Fault Simulator. Journal of CommunicationsTechnology and Electronics, 2021, 66(2): S165–S174 (SCI).
刘铁桥. test-per-clock 受控移位测试生成软件.计算机软件著作, 2021,专利号:2021SR2200184
刘铁桥,李毓君. 基于校园数字轨迹的大学生行为分析及心理危机预警研究.教育学文摘. 2021, 36(15): 190-191
Liu Tieqiao, Yu Ting, Wang Shuo, et al. An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects. IEEE Access, 2020,8:204855-204862(SCI).
刘铁桥; 余婷; 姚建荣. 实用新型专利扫描链动态重配置的确型test-per-clock测试装置. 2020-9-1, 中国, ZL201921961808.0
Liu Tieqiao, Liu Peng, Liu Yi. An efficient controlled LFSR hybridBIST scheme.IEICE Electronics Express, 15(8),2018(SCI).
刘铁桥, 王晓耘, 柳毅. 一种小时延缺陷演绎模拟器实现方法. 国家发明专利, 2018, 专利号:ZL201610377229.6.
刘铁桥, 牛小燕, 杨洁,等. 一种高效的混合 Test-Per-Clock 测试方法,电子与信息学报, 2017, 39(9):2266-2271 (EI).
Liu Tieqiao; Zhou Yingbo; Liu Yi; Cai Shuo. Harzard-Based ATPG for Improving Delay Test Quality. Journal of Electronic Testing, Volume 31,Issue 1, 2015, Page 27-34 (SCI).
Liu Tieqiao; Kuang Jishun; Cai Shuo; You Zhiqiang. An EfficientSmall-Delay Faults Simulator Based on Critical Path Tracing. International Journal of Circuit Theory and Applications.2015; 43(8): 1015–1023 (SCI).
刘铁桥; 邝继顺; 蔡烁; 尤志强. 一种将测试集嵌入到Test-Per-Clock位流中的方法.计算机研究与发展. 2014, 51(9):2022-2029 (EI).
Liu Tieqiao; Kuang Jishun; You Zhiqiang; Cai Shuo. An EffectiveDeterministic Test Generation for Test-Per-Clock Testing. IEEE Aerospace & Electronic Systems Magazine. 2014; 29(5): 25-33 (SCI).
Liu Tieqiao; Kuang Jishun; Cai Shuo; You Zhiqiang. An EffectiveLogic BIST Scheme Based on LFSR-Reseeding and TVAC. International Journal of Electronics. 2014; 101(9): 1217- 1229 (SCI).
Liu Tieqiao; Kuang Jishun; Wang Weizheng; You Zhiqiang; Cai Shuo.Embedding N-detect test set into controlled bits stream. InternationalJournal of Digital Content Technology and its Applications. 2011; 5(10): pp. 271-278 (EI).
Jie Yang, Haibin Zhu, Tieqiao Liu. Secure and economical multi-cloud storage policy with NSGA-II-C [J]. Applied Soft Computing Journal, Volume 83, 2019, 105649 (SCI, JCR 2区).
Yi Liu, Tieqiao Liu. The hybrid intelligence swam algorithm for berth-quay cranes and trucks scheduling optimization problem [C]. IEEE 15th International Conference on Cognitive Informatics & Cognitive Computing, Palo Alto CA, 2017:288-293 (EI).
Shuo Cai, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, and Wei Wang. Reliability evaluation of logic circuits based on transient faults propagation metrics [J]. IEICE Electronics Express, 2017, 14(7):1-7 (SCI).
Jie Yang, Haibin Zhu, Xianjun Zhu, Yi Liu, Linyuan Liu, Tieqiao Liu. Resource allocation policy based on trust in the multi-cloud environment [C]. 2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC), Banff Center, 2017: 3207-3212 (EI).
蔡烁, 邝继顺, 刘铁桥, 凌纯清, 尤志强. 基于伯努利分布的逻辑电路可靠度计算方法. 电子学报. 2015, 43(11):2292-2297(EI)
CAI Shuo, Kuang Jishun, Liu Tieqiao, Wang Weizheng. Soft Error Susceptibility Analysis for Sequential Circuit Elements Based on EPPMs. Journal of Semiconductor Technology and Science. 2015, 15(2): 168-176 (SCI)
蔡烁, 邝继顺, 刘铁桥, 周颖波. 一种高效的门级电路可靠度估算方法. 电子与信息学报. 2013, 35(5): 1262-1266(EI)
蔡烁, 邝继顺, 刘铁桥, 王伟征. 考虑信号相关性的逻辑电路可靠度计算方法. 电子学报. 2014, 42(8): 1660-1664(EI)
蔡烁, 邝继顺, 张亮, 刘铁桥, 王伟征. 基于差错传播概率矩阵的时序电路软错误可靠性评估. 计算机学报. 2015, 38(5): 923-931 ( EI )
胡进, 邝继顺, 刘铁桥. 一种新的小时延故障模拟器.仪器仪表学报, 2012, 33(10): 2357-2363 (EI)
蔡烁, 杨致远, 刘铁桥, 王伟征. 针对扫描阻塞结构的测试数据压缩方案. 计算机应用研究, 2012, 29(4): 1378-1380(EI)